Iron Containing Supplement Biofer Investigated by X-ray Fluorescence, Energy Dispersive X-Ray Spectroscopy and Mössbauer Spectroscopy

X-ray Absorption Spectroscopy Using X–ray Fluorescence Spectrometer

Strong characteristic Kα X-ray lines are accompanied by weak lines due to the radiative Auger effect (RAE) [1, 2]. The characteristic Kα fluorescent X-rays (K-L2,3 lines) are emitted by the 2p→1s electric dipole transition after one of the 1s electron photoionization, Though the probability is less than 0.01, one of the 2p electrons is excited into an unoccupied discrete or continuum level simu...

Max-Phases Investigated by Soft X-Ray Emission Spectroscopy

The electronic structures of the MAX-phases Ti3AlC2, Ti3SiC2 and Ti3GeC2 were investigated by soft X-ray emission spectroscopy. These nanolaminated carbide compounds represent a class of layered materials with a combination of properties from both metals and ceramics. The bulksensitive soft X-ray emission technique is shown to be particularly useful for detecting detailed electronic structure i...

Crystallization of Amorphous Germanium Investigated by X-ray Absorption Spectroscopy

Silicon Lithium Detectors for Synchrotron Energy Dispersive X-Ray Fluorescence Spectroscopy

Introduction Detector description and its principle of operation Detector module. Detector Features and its Performance EDXRF of Fe 55 Spectrum Detector comparison with Silicon Drift Detector SDD Concluding remarks References A Silicon Lithium Si(Li) detector is presented. The detector structure and its working principle are explained. The detector is cooled to 77o K by liquid Nitrogen. The det...

Energy-dispersive X-ray emission spectroscopy using an X-ray free-electron laser in a shot-by-shot mode.

The ultrabright femtosecond X-ray pulses provided by X-ray free-electron lasers open capabilities for studying the structure and dynamics of a wide variety of systems beyond what is possible with synchrotron sources. Recently, this "probe-before-destroy" approach has been demonstrated for atomic structure determination by serial X-ray diffraction of microcrystals. There has been the question wh...